Microstructure Characterization

GE-SEIFERT XRD Residual Stress and Texture Analyzer

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NICON Eclipse Optical Microscope

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STRESSTECH Hole Drilling Residual Stress Analyzer

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STRESSTECH Magnetic Barkhausen Analyzer

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STRESSTECH Portable XRD Residual Stress Analyzer

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ZEISS Scanning Electron Microscope

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ZWICK Micro Hardness Instrument

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Brüker - Fourier Transform Infra-Red

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ZWICK Hardness Testing Machine

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Brüker Q4 Spectrometry

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ZEISS Merlin Scanning Electron Microscope

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SINT Restan MTS3000

 

BRUKER D2 Phaser

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